【英文标准名称】:Semiconductordevices-Mechanicalandclimatictestmethods-Part14:Robustnessofterminations(leadintegrity)
【原文标准名称】:半导体器件.机械和气候试验方法.第14部分:终端装置的坚固性(引线牢固性)
【标准号】:IEC60749-14-2003
【标准状态】:现行
【国别】:国际
【发布日期】:2003-08
【实施或试行日期】:
【发布单位】:国际电工委员会(IX-IEC)
【起草单位】:IEC/TC47
【标准类型】:()
【标准水平】:()
【中文主题词】:电子设备及元件;温度;尺寸;电子工程;环境;平容器;耐力;半导体器件;易燃性;热学;组件;半导体;试验条件;电气工程;大气压;集成电路;试验;环境试验;气候;外观检查(试验);气候试验;潮气;温度变化;金属外壳;电学测量;密封性;机械试验
【英文主题词】:Atmosphericpressure;Bendingstress;Changesoftemperature;Climate;Climatictests;Components;Dimensions;Electricalengineering;Electricalmeasurement;Electronicengineering;Electronicequipmentandcomponents;Enclosures;Environment;Environmentaltesting;Environmentaltests;Flammability;Flatpack;Heat;Integratedcircuits;Mechanicaltesting;Metalcasings;Moisture;Resistance;Semiconductordevices;Semiconductors;Strengthofmaterials;Temperature;Testing;Testingconditions;Tightness;Torque;Types;Visualinspection(testing)
【摘要】:Providesvarioustestsfordeterminingtheintegritybetweenthelead/packageinterfaceandtheleaditselfwhenthelead(s)arebentduetofaultyboardassemblyfollowedbyreworkofthepartforre-assembly.Applicabletoallthrough-holedevicesand
【中国标准分类号】:L40
【国际标准分类号】:31_080_01
【页数】:36P.;A4
【正文语种】:英语